XtaLAB Synergy-ED Electron Diffractometer

Description

The XtaLAB Synergy-ED is an integrated system for 3D electron diffraction (3DED/microED), developed through a collaboration between Rigaku and JEOL. It is designed for determining the three-dimensional molecular structures of nanocrystals and sub-micron crystals, with capabilities extending to samples as small as tens of nanometers. This addresses a limitation of conventional X-ray diffraction, which typically requires larger crystals. The system combines JEOL's 200 kV electron source and beam control optics with Rigaku's high-speed, high-sensitivity HyPix-ED photon-counting detector. Data collection and analysis are performed using the CrysAlisPro-ED software, an interface familiar to users of Rigaku's X-ray diffraction systems. The workflow includes AutoChem for automated structure solution and refinement during data acquisition. Its compact form factor allows it to be situated alongside X-ray diffractometers as a complementary technique for structural analysis of very small crystalline materials.