
XtaLAB mini™ II Benchtop X-ray Diffraction/Crystallography System
Manufacturer: Rigaku Corporation
SKU: XtaLAB mini II
Description
The XtaLAB mini II is a compact benchtop instrument designed for single-crystal X-ray diffraction analysis. It enables the determination of three-dimensional molecular structures suitable for publication, providing an accessible alternative to shared departmental facilities. This system allows research groups to analyze newly synthesized compounds without delays. Its design incorporates a 600 W X-ray tube paired with a SHINE optic, a specialized curved monochromator, to deliver sufficient X-ray flux for research-grade data collection. The instrument features an air-cooled HPC detector positioned to meet the angular coverage requirements of major crystallography journals. With dimensions of 560 mm wide, 395 mm deep, and 674 mm high, it operates on standard 110 VAC power, requiring no special infrastructure. An optional cryosystem is available. The XtaLAB mini II is also promoted as a teaching tool, allowing students to gain hands-on experience with crystal mounting, centering, and diffraction concepts on a robust, simplified platform.
Specifications
| Item | XtaLAB mini™ II Benchtop X-ray Diffraction/Crystallography System |
| Company | Rigaku Corporation |
| Catalog Number | XtaLAB mini II |
| Quantity | EA |
| Type | X-ray Diffraction |
| Resolution | Inquire |
| Scanning Speed | Inquire |
| Dimensions | (WxDxH) 560 x 395 x 674 mm |
| Applications | Study of the three-dimensional structure of chemical compounds: composition of atoms, their relative orientation, the chemical bonds between the atoms (both bond lengths and bond angles) |
| X-Ray Tube | standard X-ray tubes |
| X-Ray Generator | Standard sealed tube X-ray source running at 600 W coupled to a special curved monochromator to produce usable X-ray flux comparable to a standard X-ray diffractometer |
| Goniometer Type | Rugged two-axis goniometer with fixed detector |
| Scanning radius | Inquire |
| Detector(s) | HyPix-Bantam two-dimensional semiconductor X-ray detector |
| Analysis Diameter | Inquire |