TrueSurface – Topographic Raman Imaging

Description

TrueSurface, from Oxford Instruments, is a microscopy option that integrates confocal Raman imaging with simultaneous surface topography mapping. This patented technology uses an integrated optical profilometer to guide the Raman measurement, automatically maintaining optimal focus across samples with rough, inclined, or irregular surfaces. By acquiring topographic and chemical data in a single pass, it enables accurate three-dimensional chemical characterization without the focus drift that can affect long measurements. The system allows for a variable offset from the sample surface and is designed to integrate with Raman, photoluminescence (PL), and white-light microscopy modalities. A primary benefit is the reduction in sample preparation effort, as it can reliably analyze unprepared or topographically complex specimens across UV, visible, and near-infrared (UV-VIS-NIR) wavelength ranges.