
SolidSpec 3700i UV-VIS-NIR spectrophotometer
Manufacturer: Shimadzu
SKU: SolidSpec 3700i
Description
The Shimadzu SolidSpec 3700i is a double-beam spectrophotometer designed for measurements across the ultraviolet, visible, and near-infrared spectral regions. It operates over a broad wavelength range from 240 to 2600 nanometers with a resolution of 0.1 nm. This instrument is engineered with a focus on applications within the electronics and optics industries, such as analyzing flat panel displays, semiconductors, and optical materials. A key feature is its large sample compartment, measuring 900 mm wide by 700 mm deep by 350 mm high, which accommodates sizable samples without requiring their alteration. The vertical optical path allows samples to remain in a horizontal orientation during measurement. For automated analysis, an optional X-Y stage can be mounted to scan an entire 12-inch or 310 x 310 mm sample area. Detection is handled by three specialized detectors: a photomultiplier tube for UV-Vis light and separate InGaAs and PbS detectors for the near-infrared region, contributing to high sensitivity. The system includes LabSolutions UV-Vis software for instrument control and data management. With appropriate software packages, the instrument can support compliance with various pharmacopeial standards (JP, USP, EP) and regulations including GLP/GMP and FDA 21 CFR Part 11. A related model, the 3700i DUV, extends measurement capability into the deep ultraviolet region.
Specifications
| Item | SolidSpec 3700i UV-VIS-NIR spectrophotometer |
| Company | Shimadzu |
| Catalog Number | SolidSpec 3700i |
| Quantity | EA |
| Type | UV VIS NIR |
| Wavelength Range | 240 to 2600 nm |
| Resolution | 0.1 nm |
| Optical System | Double Beam |
| Light Source | 50W Halogen lamp, Deterium lamp |
| Scanning Speed | 3600nm/min for PMT |
| Wavelength Accuracy | +/- 0.2 nm (UV VIS), +/- 0.8 nm (NIR) |
| Spectral Bandwidth | 0.1, 0.2, 0.5, 1, 2, 3, 5, 8 nm (UV and Vis regions); 0.2, 0.5, 1, 2, 3, 5, 8, 12, 20, 32 nm (NIR region) |