SiN Window Chip
Manufacturer: JEOL USA, Inc.
SKU: SiN Window Chip
Description
A SiN Window Chip is a specialized substrate for transmission electron microscopy (TEM) sample preparation. It consists of a thin silicon nitride (SiN) film, typically a few nanometers to several hundred nanometers thick, supported by a silicon frame. The standard format is a 3 mm diameter disc with a frame thickness of approximately 200 µm, ensuring compatibility with conventional TEM specimen holders. The transparent, low-background nature of the SiN film minimizes electron scattering, facilitating high-contrast imaging over large, continuous areas up to a millimeter in scale. This design eliminates the obstructive grid bars found in standard TEM grids, making it particularly useful for examining serial sections or performing correlative light and electron microscopy (CLEM) workflows. For CLEM applications, a dedicated retainer kit is available.
Specifications
| Item | SiN Window Chip |
| Company | JEOL USA, Inc. |
| Catalog Number | SiN Window Chip |
| Quantity | EA |
| Material | SiN is a transparent, low-background material, allowing for clear imaging in TEM |
| Film Thickness | Few nanometers to a few hundred nanometers. Thinner films offer better transmission and less scattering, while thicker films provide more mechanical stability |
| Size(s) | The chip is generally a 3mm diameter disc to fit standard TEM grid holders. Frame Thickness: The silicon frame thickness is typically 200µm for compatibility with standard TEM grid holders. |