SENTERRA II Dispersive Raman Microscope

Description

The SENTERRA II is a dispersive Raman microscope spectrometer configured for confocal Raman microscopy and analytical research applications. A defining characteristic of the system is its integrated SureCal® continuous internal calibration, which is designed to maintain high wavenumber accuracy over time without requiring calibration with external standards. The instrument incorporates the spectrometer directly within the microscope body, situated between the illuminator and the binoculars. This compact design results in a short optical path, which is intended to enhance signal sensitivity and improve overall mechanical stability and robustness by reducing alignment complexities. The system supports multiple laser excitation wavelengths, including 488nm, 532nm, 633nm, 785nm, 830nm, and 1064nm. It features FlexFocus™ for high-performance confocal depth profiling and includes Automatic Fluorescence Rejection (AFR) capability, often utilizing Shifted Excitation Raman Difference Spectroscopy (SERDS). The SENTERRA II platform is available in standard, open-architecture (for larger samples like artworks), and inverted (for live cell investigation) configurations. It can also be coupled with Atomic Force Microscopy (AFM) for correlated analysis.