RISE Microscopy – Raman Imaging-SEM

Description

RISE Microscopy, from Oxford Instruments, is an integrated correlative microscopy system that combines scanning electron microscopy (SEM) with confocal Raman imaging. This technique allows researchers to correlate ultra-structural surface details obtained via SEM with molecular and chemical compound information derived from Raman spectroscopy within a single instrument. The system facilitates quick switching between Raman and SEM measurement modes and includes automated sample transfer between the respective analysis positions. An integrated software interface provides control for both techniques and enables the overlay and correlation of results. The instrument is designed to deliver the full capabilities of both a standalone SEM and a confocal Raman microscope without compromise, operating across UV-VIS-NIR wavelengths and utilizing CCD or EMCCD detectors.