Optical Fiber NSOM Probe

Description

Nanonics Imaging supplies a range of optical fiber probes for near-field scanning optical microscopy (NSOM). These probes are designed for operation across a broad wavelength spectrum from ultraviolet to infrared (350 to 1550 nm). A distinctive product line includes cantilevered optical fiber probes, where a metal-coated, bent fiber tip functions similarly to an atomic force microscope (AFM) cantilever, enabling normal-force feedback for tip-sample distance regulation. The company also manufactures straight tapered fiber probes suitable for simultaneous NSOM and shear-force AFM imaging. Probe variants include those with apertures as small as 50 nanometers, silver or gold nanoparticle tips, roughened and metal-coated tips, hollow probes, and designs optimized for deep UV or polarization-preserving applications. For non-contact operational modes, these probes have resonant frequencies ranging from approximately 80 to 390 kHz. They are compatible with Nanonics NSOM microscope systems.