NeoARM Atomic Resolution Microscope
Manufacturer: JEOL USA, Inc.
SKU: NeoARM
Description
The NeoARM from JEOL USA, Inc. is a scanning transmission electron microscope (STEM) configured for atomic-resolution imaging and analytical spectroscopy. The instrument operates across a range of accelerating voltages, with 80 kV and 200 kV as standard and 30 kV, 60 kV, and 120 kV available as options. It achieves a specified resolution of 0.19 nanometers in TEM mode and 71 picometers in STEM mode. A core component of the system is a cold field emission gun electron source, which is combined with a next-generation aberration corrector (ASCOR) designed to enhance image clarity. For elemental analysis, the microscope is equipped with two large-area silicon drift detectors to enable high-speed energy-dispersive X-ray spectroscopy (EDS). An Annular Bright Field (ABF) detector is also included as part of the standard configuration.
Specifications
| Item | NeoARM Atomic Resolution Microscope |
| Company | JEOL USA, Inc. |
| Catalog Number | NeoARM |
| Quantity | EA |
| Resolution | 0.19 nm (TEM mode) and a scanning TEM resolution of 71 pm |
| Accelerating Voltage | 30 to 200 kV (80, 200 kV : standard, 30, 60, 120 kV : optional) |
| Detector(s) | New ABF (Annular Bright Field) detector |