Monochromated ARM200F
Manufacturer: JEOL USA, Inc.
SKU: Monochromated ARM200F
Description
The Monochromated ARM200F is a scanning/transmission electron microscope (S/TEM) engineered for ultra-high-resolution imaging and spectroscopy. A key feature is its double Wien filter monochromator, which provides a highly coherent electron beam with reduced energy spread. This design enables exceptional energy resolution for electron energy-loss spectroscopy (EELS) while maintaining the instrument's analytical capabilities at the atomic scale. Performance specifications include a STEM high-angle annular dark-field (HAADF) resolution of 70 picometers at 200 kV and a TEM information limit of 100 picometers at the same voltage. The system operates at accelerating voltages from 30 to 200 kV, offering TEM magnifications up to 2,000,000x and STEM magnifications up to 150,000,000x. It is equipped with a high-sensitivity energy-dispersive X-ray (EDS) detector, the JED-2300, and a Gatan GIF Quantum spectrometer for EELS analysis. This configuration makes the instrument suitable for advanced materials science research requiring simultaneous atomic-scale structural and chemical characterization with high energy resolution.
Specifications
| Item | Monochromated ARM200F |
| Company | JEOL USA, Inc. |
| Catalog Number | Monochromated ARM200F |
| Quantity | EA |
| Resolution | STEM HAADF: 70 pm (200 kV), 100 pm (80 kV), 160 pm (30 kV). TEM Information Limit: 100 pm (200 kV), 110 pm (80 kV), 250 pm (30 kV). TEM Point-to-Point Resolution: 0.1 nm at 200 kV. |
| Detector(s) | Energy-Dispersive X-ray Detector (EDS): JED-2300, with a solid angle of 1.76 sr, and a resolution of 133 eV. EELS Detector: Gatan GIF Quantum. |
| Accelerating Voltage | 30 to 200 kV |
| Magnification | TEM: Up to 2,000,000x. STEM: Up to 150,000,000x. |