miXcroscopy™ Linked Optical & Scanning Electron Microscopy System

Description

The miXcroscopy system from JEOL USA is an integrated microscopy platform that links an optical microscope (OM) with a scanning electron microscope (SEM). Its core innovation is a universal specimen holder compatible with both instruments, allowing a sample to be transferred between them without being remounted. Dedicated software manages stage coordinates, enabling users to record specific locations of interest during optical observation and then automatically navigate the SEM to those exact same areas for higher-magnification, higher-resolution imaging. This seamless correlation eliminates the need to manually re-locate targets within the SEM, saving time and ensuring precise positional alignment. The system facilitates direct comparison and verification of data obtained from optical and electron microscopy techniques, making it a valuable tool for researchers who require multi-scale analysis of a sample's structure, from a macroscopic overview down to fine ultrastructural details.