MiniFlex Benchtop X-ray Diffractometer

Description

The MiniFlex benchtop X-ray diffractometer from Rigaku Corporation is a compact, sixth-generation instrument designed for multipurpose materials analysis. This vertical goniometer system, with a scanning radius of 150 mm, operates with an X-ray generator capable of using copper, cobalt, iron, or chromium sources at 40 kV and 15 mA. Its applications include phase identification and quantification, determination of percent crystallinity, and analysis of crystallite size and strain. The system also supports lattice parameter refinement, Rietveld refinement, and molecular structure studies. Engineered for ease of use, it features a factory-aligned goniometer, a fail-safe radiation enclosure, an incident beam variable slit, and operation via a laptop computer. Common in both academic research and industrial quality control, particularly in material science and chemistry, the MiniFlex can be enhanced with optional accessories. These include an eight-position autosampler, a graphite monochromator, the D/teX Ultra silicon strip detector, the HyPix-400 MF 2D HPAD detector, an air-sensitive sample holder, and a travel case.