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microCMA Compact Auger Analyzer
Surface Area AnalyzerLaboratory Analytical Instruments

microCMA Compact Auger Analyzer

Manufacturer: RBD Instruments

SKU: microCMA

Description

RBD Instruments' microCMA is a compact cylindrical mirror analyzer (CMA) for Auger electron spectroscopy (AES). This non-scanning, surface-sensitive analyzer is engineered for applications where elemental composition data from the top few atomic layers is required, but imaging capability is not. Its design focuses on a proven second-order focusing CMA geometry, which provides high transmission and resolution. The unit is notably compact, designed to mount on a standard 70 mm (2.75-inch) outer diameter flange, requiring a 1.52-inch inner diameter tube. It interfaces via USB and is controlled through dedicated software described as straightforward to operate. With a specified signal-to-noise ratio of 100:1 on a clean silver sample using a 300 nA beam current, the instrument is suited for quantitative analysis of thin films and surface contaminants. Typical applications include measuring passive oxide thickness on semiconductors and metals, analyzing thermal oxides on metal components, investigating integrated circuit contamination, characterizing sputtered or deposited layers via depth profiling, and quantifying light element surface films.

Specifications

ItemmicroCMA Compact Auger Analyzer
CompanyRBD Instruments
Catalog NumbermicroCMA
ApplicationsThin film composition, Passive oxide thicknesses in semiconductors and metals, Metal component thermal oxides, Integrated circuit contamination, Characterization of sputtered layers, Auger depth profiles of deposited layers, Quantization of light element surface films
QuantityEA
TypeSingle Pass CMA (Cylindrical Mirror Analyzer)
Signal-to-Noise Ratio100:1 on clean silver with 300 nA beam current
Mount70 mm (2.75”) OD. Needs 1.52" ID tube
ControlUSB protocol, software controlled