
JES-X320 Electron Spin Resonance Spectrometer
Manufacturer: JEOL USA, Inc.
SKU: JES-X320
Description
The JES-X320 is an electron spin resonance spectrometer engineered for sensitive detection of paramagnetic species. It is designed to balance analytical performance with operational accessibility. A key specification is its sensitivity of 6 x 10^9 spins per 10^-4 Tesla when using 100 kHz modulation. The system incorporates a cylindrical TE011 mode resonator, which offers improved modulation field uniformity and can accept relatively large sample volumes. For magnetic field control, it uses an electromagnet system with a homogeneity of 6 x 10^-6 over a 24 cm diameter and employs a linear sweep circuit based on Hall element feedback for precise field regulation. Operational control is managed through a Windows-based software interface, which facilitates tasks like automated microwave circuit tuning. The instrument supports flexible, sequential measurement protocols where parameters such as temperature or sample rotation angle can be programmed and randomized. Its microwave source utilizes a solid-state Gunn diode, noted for operational stability and a long service life exceeding 20,000 hours.
Specifications
| Item | JES-X320 Electron Spin Resonance Spectrometer |
| Company | JEOL USA, Inc. |
| Catalog Number | JES-X320 |
| Quantity | EA |
| Sensitivity | 6 x 109 spins / 10-4 T (at 100 kHz modulation) |
| Diameter | 24 cm |
| Homogeneity | 6 x 10-6 |