JEM-F200 Multipurpose Analytical S/TEM
Manufacturer: JEOL USA, Inc.
SKU: JEM-F200
Description
The JEM-F200 is a 200 kV multipurpose analytical scanning/transmission electron microscope designed as a versatile workhorse for materials characterization. It features a cold field emission gun (CFEG) for a narrow energy spread and high brightness, coupled with a quad-lens condenser system for flexible probe formation. The TEM point resolution ranges from 0.19 nm to 0.23 nm, with a lattice resolution of 0.1 nm and an information limit of ≤0.12 nm. In HAADF-STEM mode, the resolution is between 0.14 nm and 0.16 nm. The stage provides precise movement of ±1.0 mm in X and Y, with a Z-range of ±0.1 mm (or ±0.2 mm for high-resolution configurations). Tilting capabilities include ±25° on two axes with a double-tilt holder and up to ±60° or ±80° with a high-tilt holder, depending on the configuration. The system is commonly configured with dual large-area silicon drift detectors for efficient EDS analysis. Available options include electron energy-loss spectroscopy (EELS), digital cameras, and tomography systems for three-dimensional reconstruction.
Specifications
| Item | JEM-F200 Multipurpose Analytical S/TEM |
| Company | JEOL USA, Inc. |
| Catalog Number | JEM-F200 |
| Quantity | EA |
| Resolution | TEM resolution (at 200 kV): Point resolution - 0.19 nm to 0.23 nm Lattice resolution - 0.1 nm Information limit - ≤0.11 nm to ≤0.12 nm STEM resolution (at 200 kV): HAADF-STEM image 0.14 nm to 0.16 nm |
| Movable Dimensions | X,Y ±1.0 mm Z ±0.1 mm X,Y ±1.0 mm Z ±0.2 mm (High resolution) |
| Angles | Ultra hugh resolution) : TX/TY (Double-tilt holder) ±25°/ ±25° TX (High-tilt holder) ±60° High resolution: TX/TY (Double-tilt holder) ±35° / ±30° TX (High-tilt holder) ±80° |
| Options | Energy-dispersive X-ray spectroscopy (EDS),Electron energy-loss spectroscopy (EELS), Digital Camera,TEM/STEM/EDS Tomography System |
| Accelerating Voltage | 20 kV~200 kV (200 kV, 80 kV are selectable as a default. Other accelerating voltages are options.) |
| Detector(s) | large-area Silicon Drift Detector |