JEM-ARM300F2 GRAND ARM Atomic Resolution Transmission Electron Microscope

Description

The JEM-ARM300F2 GRAND ARM is an aberration-corrected transmission electron microscope built for ultimate analytical performance at atomic resolution. It operates at accelerating voltages of 300 kV and 80 kV. With Cs correction enabled, it delivers a TEM lattice resolution of 50 pm at 300 kV. In STEM mode, the resolution is 53 pm at 300 kV and 96 pm at 80 kV. The system incorporates a cold field emission electron source and is equipped with an optimum bright-field STEM detector. A key design feature is a redesigned objective lens pole piece that accommodates dual, large-area silicon drift detectors for high-speed EDS, increasing the solid angle for X-ray collection without degrading spatial resolution. The instrument includes an environmental enclosure to minimize the effects of air currents, temperature fluctuations, and acoustic vibration. Automated functions for high-tension settings, corrector alignments, and lens optimization routines are integrated to simplify operation and enhance reproducibility for demanding materials science research.