JEM-3300 CRYO ARM300 II Field Emission Cryo-electron Microscope
Manufacturer: JEOL USA, Inc.
SKU: JEM-3300 CRYO ARM300 II
Description
The JEM-3300 CRYO ARM300 II is a field emission cryo-electron microscope designed for high-resolution structural biology research using single particle analysis workflows. It operates at accelerating voltages of 300 kV and 200 kV to provide the penetration power and contrast needed for imaging vitrified biological specimens. The system is engineered for exceptional mechanical and thermal stability, which is critical for achieving atomic-resolution data during automated, unattended data acquisition sessions. The specimen stage offers motor-driven movement in the X and Y axes (±1 mm) and the Z axis (±0.2 mm), with additional fine positioning provided by piezoelectric elements. The goniometer provides a tilt range of ±70 degrees. For imaging modes, the microscope is equipped with a bright-field STEM detector, and a dark-field STEM detector is available as an optional accessory. This instrument is tailored to support the high-throughput data collection demands of modern cryo-EM laboratories.
Specifications
| Item | JEM-3300 CRYO ARM300 II Field Emission Cryo-electron Microscope |
| Company | JEOL USA, Inc. |
| Catalog Number | JEM-3300 CRYO ARM300 II |
| Quantity | EA |
| Movable Dimensions | X, Y Motor drive (Movements: ± 1 mm) Piezoelectric elements Z Motor drive (Movements: ± 0.2 mm) |
| Angles | Motor drive ( Tilt: ± 70°) |
| Accelerating Voltage | 300 kV, 200 kV |
| Detector(s) | Bright-field STEM detector and dark-field STEM detector option |