JED-2300T Energy Dispersive X-ray Spectrometer (Large Angle SDD-EDS)

Description

The JED-2300T is a large solid-angle energy-dispersive X-ray spectrometer equipped with a silicon drift detector for use with transmission and scanning transmission electron microscopes. It is engineered for high-sensitivity elemental analysis at the nanoscale, compatible with TEM/STEM systems operating at accelerating voltages up to 200 kV. The SDD detector is designed to provide a large collection solid angle, which can exceed 2.2 steradians depending on the microscope configuration, facilitating rapid data acquisition. A key feature is the system's lossless drift compensation, which allows for the collection of high-pixel-count elemental maps at high resolution, even on beam-sensitive samples like 2D materials. The spectrum imaging mode captures and stores complete spectral datasets, including individual frame data, enabling flexible post-processing such as frame summation for in-situ experiments. Quantitative analysis is performed using either k-factor or ζ-factor methods. An optional electrostatic beam blanker can be integrated for precise control of electron dose at each pixel during mapping.