JED-2300 Analysis Station Plus (Embedded EDS for SEM)
Manufacturer: JEOL USA, Inc.
SKU: JED-2300
Description
The JED-2300 Analysis Station Plus is an embedded energy-dispersive X-ray spectroscopy system designed for integration with JEOL scanning electron microscopes. This microanalysis system enables real-time elemental analysis concurrent with SEM imaging. Its standard software package supports live spectral display, high-resolution elemental mapping, quantitative mapping with drift compensation, line scans, and the collection of large-area montage maps. The system is capable of detecting elements from beryllium to uranium. Typical detection limits are approximately 1% for light elements from fluorine to beryllium and around 0.1% (1000 ppm) for elements with higher atomic numbers. Detector options are available with active areas ranging from 25 mm² to 100 mm². An advanced software package, standard on certain SEM series, adds functionalities such as a user-creatable spectral library for search and match, time-resolved hyperspectral mapping playback, and quantification using standards. The system can also be configured for dual EDS analysis with an optional windowless detector.
Specifications
| Item | JED-2300 Analysis Station Plus (Embedded EDS for SEM) |
| Company | JEOL USA, Inc. |
| Catalog Number | JED-2300 |
| Quantity | EA |
| Detector(s) | EDS detector sizes ranging from 25mm 2 to 100mm 2 |
| Applications | Electron microscopy. |
| Detection Range | ≥1% for low atomic number elements (F to Be) and ≥ 0.1% (1000 ppm) for higher atomic number elements. |