JCM-7000 NeoScope Benchtop SEM

Description

The JCM-7000 NeoScope is a benchtop scanning electron microscope (SEM) from JEOL. It is designed to provide imaging and analytical capabilities in an accessible format. The system uses a tungsten filament electron source and can achieve magnifications up to 100,000x. It is equipped with both secondary electron and backscattered electron detectors. Operational modes include high and low vacuum, allowing for the examination of a wide range of conductive and non-conductive samples without extensive preparation. The chamber is relatively large for a benchtop instrument. Automated functions assist with condition setting and navigation. An optional, fully integrated EDS (Energy Dispersive X-ray Spectroscopy) system is available for elemental analysis, offering real-time spectral display during imaging. Additional features can include a color camera for stage navigation, automated montage imaging for large areas, and 3D surface reconstruction capabilities using the backscattered electron signal.