JAMP-9510F Field Emission Auger Microprobe
Manufacturer: JEOL USA, Inc.
SKU: JAMP-9510F
Description
The JAMP-9510F is a field emission Auger microprobe, a type of surface analysis instrument that combines high-resolution imaging with elemental and chemical state analysis. Manufactured by JEOL USA, Inc., it achieves a secondary electron image resolution of 3 nm at 25 kV and 10 pA. For Auger electron spectroscopy, the system provides an analytical probe diameter as small as 8 nm. This performance is enabled by a proprietary in-lens Schottky field emission electron gun paired with a low-aberration condenser lens. The instrument incorporates an electrostatic hemispherical analyzer (HSA) as its mass analyzer, with an accelerating voltage range from 0.5 to 30 kV and variable energy resolution settings between 0.05% and 0.6%. It facilitates chemical state analysis in nanoscale regions and includes a neutralizing gun for the examination of insulating materials. The sample stage accommodates specimens up to 95 mm in diameter.
Specifications
| Item | JAMP-9510F Field Emission Auger Microprobe |
| Company | JEOL USA, Inc. |
| Catalog Number | JAMP-9510F |
| Quantity | EA |
| Type | Auger microprobe |
| Resolution | 3nm(at 25kV, 10pA) |
| Mass Analyzer | Electrostatic hemispherical analyzer (HSA) |
| Accelerating Voltage | 0.5 to 30kV |
| Magnification | x 25 to 500,000 |
| Sensitivity | 840,000 cps/7 ch or more (at 10 kV 10 nA Cu-LMN, 0.6% resolution, 60tilt) |
| Specimen Size | Up to 20 mm in diameter (5 mm thick) |
| Probe Current | 10-11 to 2×10-7 A |
| Applications | Enables precise chemical bonding state analysis and compositional mapping, making it indispensable for researchers and engineers in materials science, nanotechnology, and related fields.? |
| Detector(s) | Multi-channel detection |