Hollow NSOM Imaging Probe

Description

Manufactured by Nanonics Imaging Ltd, the Hollow NSOM Imaging Probe is a specialized nanopipette designed for near-field scanning optical microscopy applications involving extreme wavelengths. Unlike conventional fiber-optic probes, this hollow structure transmits light across a broad spectrum from 0.193 micrometers in the deep ultraviolet to over 10.5 micrometers in the infrared. This capability makes it suitable for experiments with high-peak-power laser pulses in spectral regions where solid fibers are opaque or inefficient, such as vacuum UV or long-wave IR. The probe exhibits a high damage threshold, which is advantageous for techniques like nanoscale lithography or localized material ablation using femtosecond lasers. Cantilevered versions have resonant frequencies between 80 and 390 kHz. It is important to note that these probes are not optimized for general imaging purposes, as they can introduce higher noise levels due to their fixed aperture, absence of waveguiding properties, and the inability to perform in-line tip visualization. They are also incompatible with intermittent contact mode operation and are designed for use with Nanonics NSOM microscope systems.