Gather-X Windowless EDS

Description

The Gather-X is a windowless energy-dispersive X-ray spectroscopy (EDS) detector from JEOL USA, Inc., developed to provide enhanced sensitivity, particularly for light elements. Its key feature is the ability to detect characteristic X-rays down to very low energies, extending the analytical range to include lithium (Li). This is achieved through a windowless design that allows low-energy X-rays, which would be absorbed by a conventional detector window, to reach the sensor. The detector has a large 100 mm² sensor area arranged in a novel racetrack shape, which permits a large solid angle for X-ray collection even at very short working distances—as low as 2 mm. This combination enables high count rates and high spatial resolution mapping. The Gather-X is fully integrated with JEOL's SEM Center software and is compatible with the IT800 series of field-emission scanning electron microscopes (FE-SEMs). It can operate at beam voltages up to 30 kV and is designed for safe use in beam deceleration modes and at short working distances typical for high-resolution imaging.