Epsilon Xline EDXRF

Description

The Epsilon Xline is an energy-dispersive XRF (EDXRF) system engineered for direct integration into continuous manufacturing processes, such as roll-to-roll coating and thin-film production. Its purpose is to provide real-time, in-line monitoring of material composition and coating thickness without halting the production line. The spectrometer utilizes a high-resolution silicon drift detector (SDD10) and a silver anode X-ray tube, achieving a typical spectral resolution of 135 eV at 5.9 keV. A patented feature provides automatic height correction to maintain measurement accuracy despite variations in sample position during high-speed operation. By delivering continuous analytical data, the system aims to optimize material usage, minimize product that fails specifications, and increase overall process yield. The instrument is fully enclosed for X-ray safety and is built upon extensive experience in elemental analysis, developed in collaboration with industry for demanding in-line monitoring applications.