Labcritics
ElementEye JSX-1000S XRF
X Ray Fluorescence Spectrometer XRF AnalyzerSpectroscopy

ElementEye JSX-1000S XRF

Manufacturer: JEOL USA, Inc.

SKU: JSX-1000S

Description

The ElementEye JSX-1000S is a benchtop energy-dispersive X-ray fluorescence spectrometer used for elemental analysis. It can measure components from major constituents down to trace levels across a variety of sample types, including solids, powders, and liquids, often with minimal preparation. The system utilizes a silicon drift detector and operates with X-ray excitation. Its standard elemental range covers magnesium to uranium, with an optional extension to fluorine. Analytical methods include a Fundamental Parameters approach for quantitative analysis without mandatory standard samples and an optional Thin Film FP method for coating thickness measurement. Typical features may include a touchscreen interface, selectable filters for optimized sensitivity, a vacuum sample chamber, and an optional automated sample changer. Applications span quality control, material verification, and research where non-destructive elemental composition data is required.

Specifications

ItemElementEye JSX-1000S XRF
CompanyJEOL USA, Inc.
Catalog NumberJSX-1000S
QuantityEA
ApplicationsElemental analysis, analyzes major to trace components on most sample types - solids, powders, liquids
Detector(s)Silicon drift detector (SDD)
PrincipleX-ray fluorescence spectrometer
Element RangeMg to U | F to U (Option)