
ElementEye JSX-1000S XRF
Manufacturer: JEOL USA, Inc.
SKU: JSX-1000S
Description
The ElementEye JSX-1000S is a benchtop energy-dispersive X-ray fluorescence spectrometer used for elemental analysis. It can measure components from major constituents down to trace levels across a variety of sample types, including solids, powders, and liquids, often with minimal preparation. The system utilizes a silicon drift detector and operates with X-ray excitation. Its standard elemental range covers magnesium to uranium, with an optional extension to fluorine. Analytical methods include a Fundamental Parameters approach for quantitative analysis without mandatory standard samples and an optional Thin Film FP method for coating thickness measurement. Typical features may include a touchscreen interface, selectable filters for optimized sensitivity, a vacuum sample chamber, and an optional automated sample changer. Applications span quality control, material verification, and research where non-destructive elemental composition data is required.
Specifications
| Item | ElementEye JSX-1000S XRF |
| Company | JEOL USA, Inc. |
| Catalog Number | JSX-1000S |
| Quantity | EA |
| Applications | Elemental analysis, analyzes major to trace components on most sample types - solids, powders, liquids |
| Detector(s) | Silicon drift detector (SDD) |
| Principle | X-ray fluorescence spectrometer |
| Element Range | Mg to U | F to U (Option) |