
EDX-LE Energy Dispersive X-ray Fluorescence Spectrometer
Manufacturer: Shimadzu
SKU: EDX-LE
Description
Shimadzu's EDX-LE is an energy dispersive XRF spectrometer intended primarily for screening applications, such as verifying compliance with RoHS and ELV regulations. The instrument uses a rhodium-target X-ray tube, which can operate from 5 to 50 kV, paired with a silicon PIN (Si-PIN) semiconductor detector that does not require cryogenic cooling. It is capable of analyzing solid, liquid, and powdered samples. The associated software includes automated functions to simplify setup, and for certain materials, a screening judgment can be delivered in approximately one minute. The design includes a large sample chamber and is focused on providing straightforward operation with reduced running costs, making it suitable for environments that perform routine compliance checks on regulated elements.
Specifications
| Item | EDX-LE Energy Dispersive X-ray Fluorescence Spectrometer |
| Company | Shimadzu |
| Catalog Number | EDX-LE |
| Quantity | EA |
| Detector(s) | Si-PIN Semiconductor Detector |
| Principle | Energy Dispersive X-ray fluorescence |
| Sample Type | Solids, Liquids or Powder |
| X-Ray Tube | Rh target, 5 to 50 kV and 1 to 1000 uA |
| Goniometer Type | Inquire |
| Element Range | 13Al to 92U |
| Sample Chamber | (WxDxH) up to 370 x 320 x 155 mm |
| Analysis Diameter | 3, 5 and 10 mm (Automatic switching ) |