Crystal Orientation SDCOM – Desktop XRD System

Description

Focused on determining and marking in-plane crystal directions, the SDCOM is a desktop X-ray diffraction system. It employs an azimuthal scanning method, where the sample is rotated through 360 degrees while X-ray reflections are monitored. This approach enables full crystal orientation to be ascertained from one rotation, with measurement cycles often concluding in under five seconds. The apparatus is fitted with a 30-watt, air-cooled X-ray tube featuring a copper anode and utilizes scintillation counter detection technology. It can accommodate samples with diameters from as small as 2 millimeters up to 200 millimeters, and is able to analyze crystal specimens as minute as 1 mm. Depending on the sample, orientation precision can achieve 0.01 degrees. Principal applications involve production-line quality control for wafer manufacturing, materials research, and the marking of lateral crystal axes. The system is applicable to a wide spectrum of materials across multiple crystal systems, including cubic, tetragonal, hexagonal, trigonal, and orthorhombic structures. Examples are silicon, gallium arsenide, sapphire, quartz, and different polytypes of silicon carbide. The unit's compact form and user-friendly software are intended to make it operable by personnel with varying expertise levels.