Crystal Orientation Omega/Theta - X-Ray Diffractometer

Description

Configured for automated crystal orientation analysis, the Omega/Theta X-Ray Diffractometer serves both manufacturing and research applications. The system uses a standard copper-anode X-ray tube and can be outfitted with a single or a pair of scintillation counter detectors. It requires a 208-240 volt, 16 amp single-phase power source. A defining feature is its measurement scan, which derives complete crystal orientation information from data captured during one rotational cycle, yielding high-precision results in a matter of seconds. Designed for automated process integration, the instrument offers connectivity options for Manufacturing Execution Systems (MES) and the SECS/GEM communication standard. It is capable of characterizing many common single-crystal materials found in semiconductor and optical device fabrication, such as silicon, germanium, silicon carbide, gallium nitride, and lithium niobate. Its functionality is extended by optional accessories, which may include automated X-Y stages for creating orientation maps, stacking stages for aligning ingots, and components for rocking curve analysis. A selection of sample holders supports a wide variety of specimen sizes, from large boules to small cylindrical pieces.