Crystal Orientation DDCOM – Desktop XRD System

Description

The Crystal Orientation DDCOM is a compact benchtop X-ray diffractometer engineered for the fast and precise identification of crystal lattice orientation. Its operational principle is based on a specialized scanning technique that gathers all required data from a single sample rotation, reducing measurement time to around ten seconds. This represents a notable efficiency gain over conventional orientation techniques. The instrument incorporates two scintillation counters and is powered by an air-cooled X-ray tube, which removes the necessity for external water cooling and simplifies operation. With physical dimensions of 600 mm in width, 600 mm in depth, and 850 mm in height, and a mass of 80 kilograms, the system has a small footprint suitable for diverse laboratory and industrial locations. Its main uses are the accurate establishment and marking of crystal orientation for subsequent processing steps like cutting, grinding, and polishing, alongside applications in quality assurance and materials science investigations. The device can attain an orientation accuracy as fine as 0.01 degrees. It is compatible with numerous single-crystal substances, covering cubic systems such as silicon and gallium arsenide, hexagonal materials including silicon carbide and sapphire, and various tetragonal and orthorhombic crystals.