Cross Section Polisher

Description

The Cross Section Polisher (CP) is an ion beam milling instrument used for preparing samples for electron microscopy and related analytical techniques like SEM, EPMA, and SAM. Its function is to create high-quality, damage-free cross sections of diverse materials, including hard substances, soft polymers, ceramics, and composites, without introducing mechanical artifacts such as smearing or distortion. The system can produce clean, mirrored surfaces with minimal subsurface strain, even on delicate samples, and can polish areas several millimeters wide. Operation is managed through a touch panel interface. JEOL also offers a Cooling Cross Section Polisher variant (models IB-19540CP / IB-19550CCP) designed for heat-sensitive or reactive materials. This model incorporates nitrogen cooling to prevent thermal damage to low-melting-point substances and may include an air isolation transfer system to protect samples during preparation.