Axios FAST Simultaneous XRF Spectrometer

Description

The Axios FAST from Malvern Panalytical is a simultaneous wavelength-dispersive X-ray fluorescence (WDXRF) spectrometer configured for rapid, fixed-channel elemental analysis. It is capable of measuring up to 28 elements simultaneously, making it suitable for high-throughput routine analysis and real-time process control. The instrument incorporates a Super Sharp X-ray Tube (SST) with a maximum power of 4 kW, operating at up to 60 kV and 125 mA. It utilizes ZETA Technology, which is designed to counteract performance drift associated with X-ray tube aging, particularly for light elements, aiming to maintain sensitivity and low detection limits over the tube's lifetime. Detectors include a Hi-Per Scintillation detector and a Duplex detector. The system features a sample loading turret mechanism that allows new samples to be introduced while a measurement is in progress, and an optional sample changer enables unattended batch operation. For added analytical flexibility, the spectrometer can be configured with up to four programmable goniometers that can operate simultaneously alongside the fixed channels. The measuring channels are externally mounted on a compact chamber to facilitate maintenance, channel modification, and initial alignment. The Axios FAST operates using PANalytical's SuperQ software, which provides an interface for method setup and routine analysis. The system includes interfaces for connection to automated sample transport devices and host computers and serves as the basis for the TEAMworks total element analysis module.