Aeris Research Benchtop X-Ray Diffractometer

Description

The Aeris Research Benchtop X-Ray Diffractometer is a general-purpose compact XRD system for laboratory research and education. Manufactured by Malvern Panalytical, it provides a balance of performance and footprint, suitable for a range of powder diffraction applications. The standard configuration includes a copper (Cu) X-ray tube, with generator options for copper or cobalt wavelengths at power levels from 300 W to 600 W. Detection is handled by either a PIXcel 1D or PIXcel3D detector, and the goniometer is a DOPS2 type with Heidenhain encoders. The system is designed for ease of use, featuring straightforward sample loading and controlled user access. It supports offline programming of data collection routines. Optional accessories, such as a 2D detector for educational demonstrations or a non-ambient chamber for temperature-dependent phase transition studies, extend its versatility for academic and industrial research settings.